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LHT-160 Portable Hardness Tester

LHT-160 Portable Hardness Tester

LHT-160 Portable Hardness Tester

• External impact device LEEB hardness tester
• Interchangeable impact device to expland testing capabilities
• Integrated printer, data and statistics
• Measure Rockwell, Vickers, Brinell & more

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The LHT-160 Series LEEB Hardness tester from Starr Instruments is designed for users wanting the ultimate in hardness testing capabilities with comprehensive data results display and storage. Available with different impact devices to perform almost any metal hardness testing from large, unmachined castings through to small finished components. It is commonly used in production QC and to determine fit for purpose and to gauge condition of metal parts and components.

The LHT-160 series is easy to operate and calibrate with the included reference hardness test block and achieves highly accurate and repeatable results within ±6 HLD as standard.

The LHT-160 Series uses the LEEB rebound method of testing and the results are displayed on the pda alongside conversions to the scales of HRC, HRB, HB, HV, MPa and Shore.  You can then one-touch print, or you can save the data and transfer to your PC later with the included USB cable.  The key feature which enables the LHT-160 Series to measure a wide range of results is the ability to interchange the impact device.  This makes the LHT-160 series more economical as it is much better value to only have to buy an additional impact device rather than an additional complete tester.


FEATURES:

• Large, colour TFT display
• Dual hardness value display in HL and user selected unit (HRC, HRB, HB, HV, MPa, HS Shore Duro)
• Software included
• Test set data summary screen
• Auto Impact Device recognition
• Integrated printer


There are different impact devices to suit different applications. The most common type is the D type.

D Type impact devices are suitable for general use on most steels and other metal with thickness over 5mm and bulk weight above 5kg

DC Type Impact devices are suitable for small spaces such as the inner face of pipework or in recessed areas where there is minimal headroom. Only 86mm total height. 

DL Type impact devices are suitable for deep and or narrow channels, grooves and holes. Needle point only 6mm diameter.

C Type impact devices are suitable for small and lightweight work pieces less than 5mm and 2kg in weight. Also for surface hardened layers

G Type impact device is suitable to big and heavy work pieces with rough surface such as raw castings.


The "Standard Kit" consists of the tester, D type impact device, charger, cleaning brush, data cable, user manual and factory calibration certificate.  

The "Complete Kit" adds a calibration reference test block.  


SPECIFICATIONS: 

(MAIN UNIT)

HL Display Range 170 ~ 960 HLD
Repeatability ±6 HLD
Test Direction All (selectable)
Impact Device D, DC, DL, C, G
Display 3.9" backlit LCD Touchscreen
Printer 2.4G wireless direct
Operating Voltage 5VDC, 1A
Weight 300gm
Communication USB
Calibration Certificate Factory supplied


(INDENTER) 

Impact Device D/DC/DL C G
Impact Energy 11mJ 2.7mJ 90mJ
Mass of Impact body 5.5g/5.5g/7.2g 3.0g 20g
Hardness of spherical test tip 1600HV
Material of spherical test tip Tungsten Carbide
Diameter of impact device 20/20/6mm 20mm 30mm
Length of impact device 147/86/202mm 141mm 255mm
Weight of impact device 75/50/60g 75g 250g
Max Hardness of workpiece 940/940/950HV 1000HV 650HV
Surface Roughness of workpiece ≤1.6µm ≤0.4µm ≤6.3µm
Min weight of workpiece (direct) >5Kg >1.5Kg >15Kg
Min weight of workpiece (supported*) 2 ~ 5Kg 0.5 ~ 1.5Kg 5 ~ 15Kg
Min weight of workpiece (coupled**) 0.05Kg ~ 2 0.02 ~ 0.5Kg 0.5 ~ 5Kg
Min thickness of workpiece (coupled) 5mm 1mm 10mm
Min thickness of hardened layer 0.8mm 0.2mm 1.2mm

 

* Supported means that the test pieces is placed on a large, stable backing such as a vice or heavy metal bench

** Coupled means the test piece needs to be physically clamped and firmly attached to a stable backing.

This is necessary to reduce the vibration and any impact absorption from the test impact which would result in inaccurate, low readings.

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